Imaging of atomic orbitals with the atomic force microscope - experiments and simulations

Annalen der Physik (Leipzig)

Volumn 10, Issue 11-12, 2001, Pages 887-910

  Giessibl, F J ^a   Bielefeldt, H ^a   Hembacher, S ^a   Mannhart, J ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

Atomic force microscope; Atomic orbitals

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMS; CALCULATIONS; COMPUTER SIMULATION; ELECTROSTATICS; SCANNING TUNNELING MICROSCOPY; SILICON; SURFACE STRUCTURE;

ATOMIC ORBITALS; INTERATOMIC FORCES; TIP SAMPLE FORCES;

CRYSTAL ATOMIC STRUCTURE;

EID: 0035202491     PISSN: 00033804     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-3889(200111)10:11/12<887::AID-ANDP887>3.0.CO;2-B     Document Type: Article

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