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Volumn 157, Issue 4, 2000, Pages 355-360
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Molecular dynamics simulations of dynamic force microscopy: Applications to the Si(111)-7×7 surface
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
COMPUTER SIMULATION;
CRYSTAL ORIENTATION;
ENERGY DISSIPATION;
ENERGY TRANSFER;
MOLECULAR DYNAMICS;
VACUUM;
DYNAMIC FORCE MICROSCOPY;
NONCONTACT ATOMIC FORCE MICROSCOPY;
SEMICONDUCTING SILICON;
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EID: 0033751178
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(99)00566-8 Document Type: Article |
Times cited : (41)
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References (19)
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