Importance of the indentation depth in tapping-mode atomic force microscopy study of compliant materials

Applied Physics Letters

Volumn 75, Issue 26, 1999, Pages 4198-4200

  Bar, G ^a   Delineau, L ^a   Brandsch, R ^a   Bruch, M ^a   Whangbo, M H ^b  

^a UNIVERSITY OF FREIBURG   (Germany)

^b NORTH CAROLINA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001376435     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125581     Document Type: Article

References (13)

1. Q. Zhong, D. Innis, K. Kjoller, and V. B. Elings, Surf. Sci. Lett. 290, L688 (1993).
2. D. A. Chernoff, Proceedings Microscopy and Microanalysis (Jones and Begell, New York, 1995).
3. For some recent reviews, see O. I. Kiselyova and I. V. Yaminsky, Colloid J. USSR 61, 1 (1999);
4. K. D. Jandt, Mater. Sci. Eng. 21, 221 (1998);
5. S. N. Magonov and D. H. Reneker, Annu. Rev. Mater. Sci. 27, 175 (1997);
6. V. V. Tsukruk, Rubber Chem. Technol. 70, 430 (1997).
7. J. Tamayo and R. Garcia, Appl. Phys. Lett. 71, 2394 (1997).
8. M.-H. Whangbo, R. Brandsch, and G. Bar, Surf. Sci. 411, L794 (1998).
9. G. Bar, R. Brandsch, and M.-H. Whangbo, Surf. Sci. 411, L802 (1998).
10. O. P. Behrend, L. Odoni, J. L. Loubet, and N. A. Burnham (unpublished).
11. M. Marth, D. Maier, J. Honerkamp, R. Brandsch, and G. Bar, J. Appl. Phys. 85, 7030 (1999).
12. The measured raw data are the root mean square (rms) values of the amplitude which are related to the amplitude by a factor of √2. To calculate δ, it is necessary to calibrate the amplitude A. This can be achieved from the slope of A(z) curves on stiff samples (e.g., mica, Si). The quality factor of the oscillation can be obtained from the width at the half-power point of the amplitude vs frequency curve.
13. S. N. Magonov, V. Elings, and M.-H. Whangbo, Surf. Sci. 375, L385 (1997).