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Physical Review B - Condensed Matter and Materials Physics

Volumn 62, Issue 23, 2000, Pages 15319-15322

Surface topography of the Si(111)-7×7 reconstruction

(3) Ke, S H a Uda, T a Terakura, K a

a JT RES CENTER FOR ATOM TECHNOLOGY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ATOMIC FORCE MICROSCOPY; CALCULATION; ELECTRON DIFFRACTION; GEOMETRY; IMAGE ANALYSIS; SCANNING TUNNELING MICROSCOPY; TOPOGRAPHY;

EID: 0034670747 PISSN: 01631829 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevB.62.15319 Document Type: Article

Times cited : (14)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.