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Volumn 75, Issue 3, 1999, Pages 433-435

Relations between interaction force and frequency shift in large-amplitude dynamic force microscopy

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Indexed keywords


EID: 0043028832     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124399     Document Type: Article
Times cited : (165)

References (13)
  • 1
    • 0012618901 scopus 로고
    • G. Binnig, C. F. Quate, and Ch. Gerber, Phys. Rev. Lett. 56, 930 (1986); for a review, see, e.g., D. Sarid, Scanning Force Microscopy with Applications to Electric, Magnetic, and Atomic Forces, Oxford Series on Optical Sciences (Oxford University Press, Oxford, 1991).
    • (1986) Phys. Rev. Lett. , vol.56 , pp. 930
    • Binnig, G.1    Quate, C.F.2    Gerber, Ch.3
  • 7
    • 0001551895 scopus 로고    scopus 로고
    • B. Anczykowski, D. Kruger, and H. Fuchs, Phys. Rev. B 53, 15485 (1996); B. Anczykowski, J. P. Cleveland, D. Kruger, V. Elings, and H. Fuchs, Appl. Phys. A: Mater. Sci. Process. 66A, S885 (1998).
    • (1996) Phys. Rev. B , vol.53 , pp. 15485
    • Anczykowski, B.1    Kruger, D.2    Fuchs, H.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.