First-principles simulation of atomic force microscopy image formation on a GaAs(110) surface: Effect of tip morphology

Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 24, 2001, Pages

  Ke, S H ^a   Uda, T ^a   Stich I ^b   Terakura, K ^c  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^b SLOVAK UNIVERSITY OF TECHNOLOGY   (Slovakia)

^c NATL INST FOR ADV INTERDISC RES   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC; GALLIUM;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONTRAST ENHANCEMENT; ENERGY; IMAGE DISPLAY; MORPHOLOGY; SIMULATION; SURFACE PROPERTY;

EID: 0034906249     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.63.245323     Document Type: Article

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