Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

Applied Surface Science

Volumn 140, Issue 3-4, 1999, Pages 352-357

  Giessibl, Franz J ^a   Bielefeldt, Hartmut ^a   Hembacher, Stefan ^a   Mannhart, Jochen ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

07.79 Lh; 34.20 Cf; 61.16 Ch; 87.64 Dz; APN; Atomic force microscopy; Atomic resolution; Dissipation; Dynamic force microscopy; Frequency modulation atomic force microscopy; Thermal noise; Tip sample interaction

Indexed keywords

EID: 0001449391     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00553-4     Document Type: Article

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