Relationship between phase shift and energy dissipation in tapping-mode scanning force microscopy

Applied Physics Letters

Volumn 73, Issue 20, 1998, Pages 2926-2928

  Tamayo, Javier ^a   García, Ricardo ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 16644390418     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.122632     Document Type: Article

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