Effect of tip morphology on image formation in noncontact atomic force microscopy: InP(110)

Physical Review B - Condensed Matter and Materials Physics

Volumn 63, Issue 24, 2001, Pages

  Tobik J ^a   Stich I ^a   Terakura, K ^b  

^a SLOVAK UNIVERSITY OF TECHNOLOGY   (Slovakia)

^b NATL INST FOR ADV INTERDISC RES   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

INDIUM; PHOSPHORUS; SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; IMAGE DISPLAY; MATHEMATICAL COMPUTING; MORPHOLOGY; SIMULATION; THEORY;

EID: 0034895282     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.63.245324     Document Type: Article

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