A unifying view on some experimental effects in tapping-mode atomic force microscopy

Journal of Applied Physics

Volumn 85, Issue 10, 1999, Pages 7030-7036

  Marth, M ^a   Maier, D ^a   Honerkamp, J ^a   Brandsch, R ^a   Bar, G ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000804346     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.370508     Document Type: Review

References (36)

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