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Surface Science

Volumn 453, Issue 1-3, 2000, Pages 152-158

The role of shear forces in scanning force microscopy: A comparison between the jumping mode and tapping mode

(5) Moreno Herrero, F a De Pablo, P J a Colchero, J a Gomez Herrero J a Baro A M a

a UNIVERSIDAD AUTÓNOMA DE MADRID (Spain)

Author keywords

Atomic force microscopy; Biological molecules nucleic acids; Carbon

Indexed keywords

EID: 0002466980 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(00)00341-1 Document Type: Article

Times cited : (43)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.