Contrast artifacts in tapping tip atomic force microscopy

Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

  Kuhle A ^a   Sorensen A H ^a   Zandbergen, J B ^a   Bohr, J ^a  

^a TECHNICAL UNIVERSITY OF DENMARK   (Denmark)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; CANTILEVER MODES; CANTILEVER OSCILLATION; DYNAMICAL PROPERTIES; OSCILLATING CANTILEVER; REPULSIVE INTERACTIONS; SUDDEN CHANGE; SWING MODE;

NANOCANTILEVERS;

ATOMIC FORCE MICROSCOPY;

EID: 0002965516     PISSN: 09478396     EISSN: 14320630     Source Type: Journal    
DOI: 10.1007/s003390051156     Document Type: Article

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11. Parameters used for the calculations are the cantilever resonance frequency, fc ≈ 157 320 Hz, the quality factor, Q ≈ 375, both determined from experimental frequency spectra, and the effective cantilever mass [14], m* = 0:24×m ≈ 0:25×10-10 Kg, determined from the dimensions of the cantilever. The probe-sample distance was set to 25 nm and the free oscillation amplitude (at fc) to 50 nm
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