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Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

Analysis of the interactionmechanisms in dynamicmode SFM by means of experimental data and computer simulation

(5) Anczykowski, B a Cleveland, J P b Kruger D a Elings, V b Fuchs, H a

a UNIVERSITY OF MÜNSTER (Germany)

b Digital Instruments (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ACTIVE FEEDBACK; DYNAMIC MODES; ELECTROSTATIC FORCE FIELDS; EXPERIMENTAL DATA; INTERACTION FORCES; INTERACTION POTENTIALS; INTERMITTENT-CONTACTS; OSCILLATING CANTILEVER; OSCILLATION AMPLITUDE; OSCILLATION STATE; OSCILLATORY MOTION; PHASE IMAGING; QUALITY FACTORS; REPULSIVE INTERACTIONS; SAMPLE SURFACE; SCANNING FORCE MICROSCOPES; SYSTEM RESPONSE; TAPPING MODES;

COMPUTATIONAL METHODS; COMPUTER CRIME; DYNAMIC RESPONSE;

COMPUTER SIMULATION;

EID: 34247631252 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s003390051261 Document Type: Article

Times cited : (176)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.