Extracting interaction forces and complementary observables in dynamic probe microscopy

Applied Physics Letters

Volumn 76, Issue 9, 2000, Pages 1203-1205

  Durig U ^a  

^a IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0344718217     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125983     Document Type: Article

References (11)

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