Silicon dopant imaging by dissipation force microscopy

Applied Physics Letters

Volumn 75, Issue 18, 1999, Pages 2785-2787

  Stowe, T D ^a   Kenny, T W ^a   Thomson, D J ^b   Rugar, D ^c  

^a STANFORD UNIVERSITY   (United States)

^b UNIVERSITY OF MANITOBA   (Canada)

^c IBM ALMADEN RESEARCH CENTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001322256     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125149     Document Type: Article

References (13)

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