Effects of elastic and inelastic interactions on phase contrast images in tapping-mode scanning force microscopy

Applied Physics Letters

Volumn 71, Issue 16, 1997, Pages 2394-2396

  Tamayo, Javier ^a   García, Ricardo ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005418557     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120039     Document Type: Article

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