New method for noncontact atomic force microscopy image simulations

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 38, Issue 1, 1999, Pages 192-194

  Sasaki, Naruo ^a   Tsukada, Masaru ^a  

^a UNIVERSITY OF TOKYO   (Japan)

Author keywords

DAS model; Forced vibration; Frequency shift; Image; Noncontact atomic force microscopy; Perturbation theory; Si(111)7 7 surface; Tip surface interaction

Indexed keywords

COMPUTER SIMULATION; DIFFERENTIAL EQUATIONS; FREQUENCY SHIFT KEYING; IMAGE PROCESSING; PERTURBATION TECHNIQUES; SEMICONDUCTING SILICON;

FREQUENCY SHIFT; IMAGE SIMULATION; NONCONTACT ATOMIC FORCE MICROSCOPY; TIP SURFACE INTERACTION;

ATOMIC FORCE MICROSCOPY;

EID: 0032677726     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.38.192     Document Type: Article

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