Bias dependence of Si(111)7×7 images observed by noncontact atomic force microscopy

Applied Surface Science

Volumn 157, Issue 4, 2000, Pages 207-211

  Arai, T ^a   Tomitori, M ^a  

^a JAPAN ADVANCED INSTITUTE OF SCIENCE AND TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTRIC POTENTIAL; IMAGING TECHNIQUES; SURFACE TOPOGRAPHY; ADHESION; ELECTROSTATICS; FORCE MEASUREMENT; MICROSCOPES; MOLECULAR DYNAMICS; NANOTUBES; SEMICONDUCTOR LASERS; SILICON; TITANIUM DIOXIDE; VOLTAGE MEASUREMENT;

CONTRAST INVERSION; NONCONTACT ATOMIC FORCE MICROSCOPY;

SILICON; SURFACE CHEMISTRY;

CONTACT POTENTIAL DIFFERENCE; DYNAMIC FORCE MICROSCOPY; EIREV; FOURIER EXPANSION METHOD; FRICTION FORCE MICROSCOPY; JOULE EXPANSION MICROSCOPE; KELVIN PROBE FORCE MICROSCOPY; NONCONTACT ATOMIC FORCE MICROSCOPY; SCANNING FORCE MEASUREMENT; SCANNING SURFACE POTENTIAL MICROSCOPY;

EID: 0034165348     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(99)00527-9     Document Type: Article

References (18)

1. Giessibl F.J. Science. 267:1995;68.
2. Kitamura S., Iwatsuki M. Jpn. J. Appl. Phys. 34:1995;L145.
3. Sugawara Y., Ohta M., Ueyama H., Morita S. Science. 270:1995;1646.
4. Lüthi R., Meyer E., Bammerlin M., Baratoff A., Lehmann T., Howald L., Gerber Ch., Güntherodt H.-J. Z. Phys. B. 100:1996;165.
5. Sokolov I.Yu., Henderson G.S., Wicks F.J. Appl. Surf. Sci. 140:1999;362.
6. Giessibl F.J. Phys. Rev. B. 56:1997;16010.
7. Pérez R., Stich I., Payne M.C., Terakura K. Appl. Surf. Sci. 140:1999;320.
8. Sasaki N., Tsukada M. Appl. Surf. Sci. 140:1999;339.
9. Erlandsson R., Olsson L., Mårtensson P. Phys. Rev. B. 54:1996;R8309.
10. Sugawara Y., Ueyama H., Uchihashi T., Ohta M., Morita S., Suzuki M., Mishima S. Appl. Surf. Sci. 113/114:1997;364.
11. Nakagiri N., Suzuki M., Okiguchi K., Sugimura H. Surf. Sci. 373:1997;L329.
12. Uchihashi T., Sugawara Y., Tsukamoto T., Ohta M., Morita S., Suzuki M. Phys. Rev. B. 56:1997;9834.
13. Molitor S., Güthner P., Berghaus T. Appl. Surf. Sci. 140:1999;276.
14. Arai T., Tomitori M. Appl. Phys. A. 66:1998;S319.
15. Tomitori M., Arai T. Appl. Surf. Sci. 140:1999;432.
16. Arai T., Tomitori M. Appl. Surf. Sci. 114-115:1999;501.
17. Takayanagi K., Tanishiro Y., Takahashi M., Takahashi S. J. Vac. Sci. Technol., A. 3:1985;1502.
18. Tromp R.M., Hamers R.J., Demuth J.E. Phys. Rev. B. 15:1986;1389.