Distance dependence of noncontact-AFM image contrast on Si(111) √3 × √3 -Ag structure

Applied Surface Science

Volumn 140, Issue 3-4, 1999, Pages 298-303

  Minobe, Tetsuya ^a   Uchihashi, Takayuki ^a   Tsukamoto, Takahiro ^a   Shigeki Orisaka, ^a   Sugawara, Yasuhiro ^a   Morita, Seizo ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

61.16Ch; 68.35.Bs; 68.35.Dv; APN; Atomic force microscopy; HCT model; Noncontact; SF; Si(111) 3 3 Ag surface; SK; UHV

Indexed keywords

EID: 0000467833     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00544-3     Document Type: Article

References (15)

1. Giessibl F.J. Science. 267:1995;68.
2. Kitamura S., Iwatsuki M. Jpn. J. Appl. Phys. 34:1995;L145.
3. Erlandsson R., Olsson L., Martensson P. Phys. Rev. B. 54:1996;R8309.
4. Nakagiri N., Suzuki M., Okiguchi K., Sugimura H. Surf. Sci. 373:1997;L329.
5. Sugawara Y., Ueyama H., Uchihasi T., Ohta M., Morita S., Suzuki M., Mishima S. Appl. Surf. Sci. 113/114:1997;364.
6. Kitamura S., Iwatsuki M. Jpn. J. Appl. Phys. 35:1996;L668.
7. Sugawara Y., Ohta M., Ueyama H., Morita S. Science. 270:1995;1646.
8. Ueyama H., Ohta M., Sugawara Y., Morita S. Jpn. J. Appl. Phys. 34:1995;L1086.
9. Uchihashi T., Sugawara Y., Tsukamoto T., Ohta M., Morita S. Phys. Rev. B. 56:1997;9834.
10. Katayama M., Williams R.S., Kato M., Nomura E., Aono M. Phys. Rev. Lett. 66:1991;2762.
11. Demuth J.E., Van Lenen E.J., Tromp R.M., Hamers R.J. J. Vac. Sci. Technol. B. 6:1988;18.
12. Wilson R.J., Chiang S. Phys. Rev. Lett. 58:1987;369.
13. Takahashi T., Nakatani S. Surf. Sci. 282:1993;17.
14. Watanabe S., Aono M., Tsukada M. Phys. Rev. B. 44:1991;8330.
15. Shibata A., Kimura Y., Takayanagi K. Surf. Sci. 275:1992;L697.