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Surface Science

Volumn 461, Issue 1-3, 2000, Pages 255-265

Dynamic force microscopy across steps on the Si(111)-(7 × 7) surface

(10) Guggisberg, M a Bammerlin, M a Baratoff, A a Luthi R a Loppacher, Ch a Battiston, F M a Lu J a Bennewitz, R a Meyer, E a Guntherodt H J a

a UNIVERSITY OF BASEL (Switzerland)

Author keywords

Atomic force microscopy; Silicon; Surface structure, morphology, roughness, and topography

Indexed keywords

EID: 0000905191 PISSN: 00396028 EISSN: None Source Type: Journal
DOI: 10.1016/S0039-6028(00)00592-6 Document Type: Article

Times cited : (39)

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