Role of damping in phase imaging in tapping mode atomic force microscopy

Surface Science

Volumn 429, Issue 1, 1999, Pages 178-185

  Wang, Lugen ^a  

^a OHIO STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ATOMIC FORCE MICROSCOPY; ELASTICITY; ENERGY DISSIPATION; HYSTERESIS; IMAGING TECHNIQUES; SURFACE PROPERTIES;

ADHESION FORCE; ELASTIC FORCE; JUMPS; PHASE IMAGING; TAPPING MODE ATOMIC FORCE MICROSCOPY;

DAMPING;

EID: 0032625637     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(99)00368-4     Document Type: Article

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