Chemically-sensitive imaging in tapping mode by chemical force microscopy: Relationship between phase lag and adhesion

Langmuir

Volumn 14, Issue 7, 1998, Pages 1508-1511

  Noy, Aleksandr ^a   Sanders, Charles H ^a   Vezenov, Dmitri V ^a   Wong, Stanislaus S ^a   Lieber, Charles M ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; ALCOHOLS; ATOMIC FORCE MICROSCOPY; MATHEMATICAL MODELS; SOLUTIONS; SURFACE PHENOMENA; WATER;

CHEMICAL FORCE MICROSCOPY; PHASE LAG; SELF ASSEMBLED MONOLAYERS;

MONOLAYERS;

EID: 0032025166     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la970948f     Document Type: Article

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37. This model assumes that the cantilever is driven at its resonance frequency, although in our experiments the cantilever was driven at the fluid mode closest to this resonance. Therefore, the model should be considered as an approximate description of the real system.