Simultaneous imaging of the In and As sublattice on InAs(110)-(1×1) with dynamic scanning force microscopy

Applied Surface Science

Volumn 140, Issue 3-4, 1999, Pages 293-297

  Schwarz, A ^a   Allers, W ^a   Schwarz, U D ^a   Wiesendanger, R ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

61.16.Ch; 61.82.Fk; 68.35.Bs; 81.05.Ea; AO; APN; Dynamic scanning force microscopy; IC; III V semiconductor; InAs(110); Low temperature scanning force microscopy; Surface structure

Indexed keywords

EID: 0000510170     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00543-1     Document Type: Article

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