Phase contrast and surface energy hysteresis in tapping mode scanning force microscopy

Surface and Interface Analysis

Volumn 27, Issue 5, 1999, Pages 312-316

  García, Ricardo ^a   Tamayo, Javier ^a   San Paulo, Alvaro ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTIC MODULI; FRICTION; GRAPHITE; HYSTERESIS; IMAGING TECHNIQUES; KINETIC ENERGY; MATHEMATICAL MODELS; NUMERICAL ANALYSIS; SURFACE TENSION;

PHASE CONTRAST IMAGING; SCANNING FORCE MICROSCOPY; SURFACE ENERGY HYSTERESIS; TIP SAMPLE INTERACTION FORCES;

ATOMIC FORCE MICROSCOPY;

EID: 0032637064     PISSN: 01422421     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1096-9918(199905/06)27:5/6<312::AID-SIA496>3.0.CO;2-Y     Document Type: Article

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