Surface-tip interactions in noncontact atomic-force microscopy on reactive surfaces: Si(111)

Physical Review B - Condensed Matter and Materials Physics

Volumn 58, Issue 16, 1998, Pages 10835-10849

  Pérez, Rubén ^a   Štich, Ivan ^a   Payne, Michael C ^a   Terakura, Kiyoyuki ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0037514481     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.58.10835     Document Type: Article

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