Ultrahigh vacuum atomic force microscopy: True atomic resolution

Surface Review and Letters

Volumn 4, Issue 5, 1997, Pages 1025-1029

  Luthi R ^a,b   Meyer, E ^a   Bammerlin, M ^a   Baratoff, A ^a   Howald, L ^a   Gerber, Ch ^b   Guntherodt H J ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

^b IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 3342885595     PISSN: 0218625X     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0218625X9700122X     Document Type: Article

References (23)

1. G. Binnig, C. F. Quate and Ch. Gerber, Phys. Rev. Lett. 56, 930 (1986).
2. For an overview of force microscopy see Forces in Scanning Probe Methods, eds. H.-J. Güntherodt, D. Anselmetti and E. Meyer, NATO ASI Series E: Applied Sciences Vol. 286 (Kluwer, 1995).
3. F. Ohnesorge and G. Binnig, Science 260, 1451 (1993).
4. F. J. Giessibl, Science 267, 68 (1995); S. Kitamura and M. Iwatsuki, Jpn. J. Appl. Phys. 34, L145 (1995).
5. F. J. Giessibl, Science 267, 68 (1995); S. Kitamura and M. Iwatsuki, Jpn. J. Appl. Phys. 34, L145 (1995).
6. P. Güthner, J. Vac. Sci. Technol. B14, 2428 (1995).
7. R. Lüthi, E. Meyer, M. Bammerlin, A. Baratoff, T. Lehmann, L. Howald, Ch. Gerber and H.-J. and Güntherodt, Z. Phys. B100, 165 (1996).
8. Y. Sugawara, M. Ohta, H. Ueyama and S. Morita, Science 270, 1646 (1995).
9. G. Binnig, H. Rohrer, Ch. Gerber and E. Weibel, Phys. Rev. Lett. 50, 120 (1983).
10. R. S. Becker, J. A. Golovchenko, E. G. McRae and B. S. Schwartzentruber, Phys. Rev. Lett. 55, 2028 (1985).
11. L. Howald, E. Meyer, R. Lüthi, H. Haefke, R. Overney, H. Rudin and H.-J. Güntherodt, Appl. Phys. Lett. 63, 117 (1993).
12. G. Tarrach, R. Wiesendanger, D. Bürgler, L. Scandella and H.-J. Güntherodt, J. Vac. Sci. Technol. B9, 677 (1991).
13. O. Ohlsson, NANOSENSORS GmbH, Aidlingen, Germany.
14. The quality factor Q = f/Δf is determined from the thermal noise power spectrum, whereby Δf is the full width of the resonance peak at 1/√2th height.
15. T. R. Albrecht, P. Grütter, D. Horne and D. Rugar, J. Appl. Phys. 69, 668 (1991).
16. o and the quality factor Q) and can therefore be derived from the resonance curve of the cantilever.
17. E. Meyer, L. Howald, R. Lüthi, H. Haefke, M. Rüetschi, T. Bonner, R. M. Overney, J. Frommer, R. Hofer and H.-J. Güntherodt, J. Vac. Sci. Technol. B12, 2060 (1994).
18. R. Lüthi, E. Meyer, L. Howald, H. Haefke, D. Anselmetti, M. Dreier, M. Rüetschi, T. Bonner, R. Overney, J. Frommer and H.-J. Güntherodt, J. Vac. Sci. Technol. B12, 1673 (1994).
19. L. Howald, R. Lüthi, E. Meyer H.-J. and Güntherodt, Phys. Rev. B51, 5484 (1995).
20. I.-W. Lyo and Ph. Avouris, Science 253, 173 (1991).
21. R. Perez, M. C. Payne, I. Stich and K. Terakura, to be published.
22. L. S. Levitov, Europhys. Lett. 8, 499 (1989).
23. M. Bammerlin, R. Lüthi, E. Meyer, A. Baratoff, J. Lü, M. Guggisberg, Ch. Gerber, L. Howald and H.-J. and Güntherodt, Probe Microscopy 1, 3 (1997).