Analysis of tip-sample interaction in tapping-mode atomic force microscope using an electrical circuit simulator

Applied Physics Letters

Volumn 78, Issue 19, 2001, Pages 2973-2975

  Sahin, O ^a   Atalar, A ^a  

^a BILKENT UNIVERSITY   (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0035821099     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1369614     Document Type: Article

References (12)

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