Damping near Solid-Liquid Interfaces Measured with Atomic Force Microscopy

Langmuir

Volumn 15, Issue 4, 1999, Pages 922-925

  O'Shea, S J ^a   Lantz, M A ^b   Tokumoto, H ^b  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DAMPING; GRAPHITE; MICA; SEPARATION; SILICON COMPOUNDS; WATER;

OCTAMETHYLCYCLOTETRASILOXANE;

PHASE INTERFACES;

EID: 0033077226     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la981109b     Document Type: Article

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