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Volumn 157, Issue 4, 2000, Pages 233-238
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Imaging reconstructed TiO2 surfaces with non-contact atomic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
SCANNING TUNNELING MICROSCOPY;
SURFACE STRUCTURE;
SURFACE TREATMENT;
NONCONTACT ATOMIC FORCE MICROSCOPY;
SURFACE RECONSTRUCTION;
TITANIUM DIOXIDE;
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EID: 0033733382
PISSN: 01694332
EISSN: None
Source Type: Journal
DOI: 10.1016/S0169-4332(99)00532-2 Document Type: Article |
Times cited : (26)
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References (29)
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