Direct and controlled manipulation of nanometer-sized particles using the non-contact atomic force microscope

Nanotechnology

Volumn 9, Issue 3, 1998, Pages 237-245

  Ramachandran, T R ^a   Baur, C ^a   Bugacov, A ^a   Madhukar, A ^a   Koel, B E ^a   Requicha, A ^a   Gazen, C ^a  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; FEATURE EXTRACTION;

NON-CONTACT ATOMIC FORCE MICROSCOPY (NC-AFM);

NANOSTRUCTURED MATERIALS;

EID: 0032156993     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/9/3/015     Document Type: Article

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