Amplitude curves and operating regimes in dynamic atomic force microscopy

Ultramicroscopy

Volumn 82, Issue 1-4, 2000, Pages 79-83

  García, Ricardo ^a   San Paulo, Alvaro ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MODULATION; FEEDBACK; MATHEMATICAL MODELS; OSCILLATORS (ELECTRONIC);

AVERAGE TIP-SAMPLE DISTANCE;

ATOMIC FORCE MICROSCOPY;

AMPLITUDE MODULATION; ARTICLE; ATOMIC FORCE MICROSCOPY; EXPERIMENTAL MODEL; FEEDBACK SYSTEM; MICROSCOPE; MOLECULAR INTERACTION; OSCILLATION; PIEZOELECTRICITY; SIMULATION;

EID: 0033967776     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00132-1     Document Type: Article

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