Interpretation of tapping mode atomic force microscopy data using amplitude-phase-distance measurements

Ultramicroscopy

Volumn 75, Issue 3, 1998, Pages 171-181

  Chen, X ^a   Davies, M C ^a   Roberts, C J ^a   Tendler, S J B ^a   Williams, P M ^a   Davies, J ^b   Dawkes, A C ^b   Edwards, J C ^b  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

^b Pollards Wood Laboratories   (United Kingdom)

Author keywords

Imaging; Methods and techniques; Scanning probe microscopy

Indexed keywords

EQUATIONS OF MOTION; IMAGING TECHNIQUES; MATHEMATICAL MODELS; PROBLEM SOLVING;

AMPLITUDE PHASE DISTANCE MEASUREMENTS; SCANNING PROBE MICROSCOPY; TAPPING MODE;

ATOMIC FORCE MICROSCOPY;

GELATIN; POLYSTYRENE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONTRAST ENHANCEMENT; DATA ANALYSIS; IMAGING; OSCILLATION; SURFACE PROPERTY;

EID: 0032411006     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(98)00068-0     Document Type: Article

References (31)

1. Q. Zhong, D. Inniss, K. Kjoller, V.B. Elings, Surf. Sci. 290 (1993) L688.
2. A.P. Quist, J. Ahlbom, C.T. Reimann, B.U.R. Sundqvist, Nucl. Instr. Meth. B 88 (1994) 164.
3. G. Binnig, C.F. Quate, C. Gerber, Phys. Rev. Lett. 56 (1986) 930.
4. S.O. Akari, E.W. van der Vegte, P.C.M. Grim, G.F. Beider, V. Koutsos, G. ten Brinke, G. Hadziioannou, Appl. Phys. Lett. 65 (1994) 1915.
5. S.N. Magonov, V. Elings, M.-H. Whangbo, Surf. Sci. 375 (1997) L385.
6. S.N. Magonov, J. Cleveland, V. Elings, D. Denley, M.H. Whangbo, Surf. Sci. 389 (1997) 201.
7. I. Schmitz, M. Schreiner, G. Friedbacher, M. Grasserbauer, Appl. Surf. Sci. 115 (1997) 190.
8. J.P. Spatz, S. Sheiko, M. Möller, R.G. Winkler, P. Reineker, O. Marti, Langmuir 13 (1997) 4699.
9. D. Krüger, B. Anczykowski, H. Fuchs, Ann. Phys. 6 (1997) 341.
10. B. Anczykowski, D. Krüger, K.L. Babcock, H. Fuchs, Ultramicroscopy 66 (1996) 251.
11. B. Anczykowski, D. Krüger, H. Fuchs, Phys. Rev. B 53 (1996) 15485.
12. N.A. Burnham, O.P. Behrend, F. Oulevey, G. Gremaud, P.-J. Gallo, D. Gourdon, E. Dupas, A.J. Kulik, H.M. Pollock, G.A.D. Briggs, Nanotechnology 8 (1997) 67.
13. J.P. Spatz, S. Sheiko, M. Möller, R.G. Winkler, P. Reineker, O. Marti, Nanotechnology 6 (1995) 40.
14. R.G. Winkler, J.P. Spatz, S. Sheiko, M. Möller, P. Reineker, O. Marti, Phys. Rev. B 54 (1996) 8908.
15. J. Tamayo, R. Garcia, Langmuir 12 (1996) 4430.
16. J. Tamayo, R. Garcia, Appl. Phys. Lett. 71 (1997) 2394.
17. J. Chen, R.K. Workman, D. Sarid, R. Höper, Nanotechnology 5 (1994) 199.
18. J.P. Cleveland, B. Anczykowski, A.E. Schmid, V.B. Elings, Appl. Phys. Lett. 72 (1998) 2613.
19. A. Kühle, A.H. Sørensen, J. Bohr, J. Appl. Phys. 81 (1997) 6562.
20. R. Brandsch, G. Bar, M.-H. Whangbo, Langmuir 13 (1997) 6349.
21. G. Bar, Y. Thomann, R. Brandsch, H.-J. Cantow, M.-H. Whangbo, Langmuir 13 (1997) 3807.
22. G. Haugstad, W.L. Gladfelter, Langmuir 10 (1994) 4295.
23. G. Haugstad, W.L. Gladfelter, E.B. Weberg, R.T. Weberg, R.R. Jones, Langmuir 11 (1995) 3473.
24. G. Haugstad, W.L. Gladfelter, E.B. Weberg, R.T. Weberg, T.D. Weatherill, R.R. Jones, Mater. Sci. Eng. C 3 (1995) 85.
25. M. Radmacher, M. Fritz, P.K. Hansma, Biophys. J. 69 (1995) 264.
26. J.P. Cleveland, S. Manne, D. Bocek, P.K. Hansma, Rev. Sci. Instr. 64 (1993) 403.
27. J.L. Hutter, J. Bechhoefer, Rev. Sci. Instrum. 64 (1993) 1868.
28. X. Chen, S.L. McGurk, M.C. Davies, C.J. Roberts, K.M. Shakesheff, S.J.B. Tendler, P.M. Williams, J. Davies, A.C. Dawkes, A. Domb, Macromolecules 31 (1998) 2278.
29. X. Chen, M.C. Davies, C.J. Roberts, S.J.B. Tendler, P.M. Williams, J. Davies, A.C. Dawkes, J.C. Edwards, Langmuir 13 (1997) 4106.
30. N.A. Burnham, G. Gremaud, A.J. Kulik, P.-J. Gallo, F. Oulevey, J. Vac. Sci. Tech. B 14 (1996) 1308.
31. M.-H. Whangbo, R. Brandsch, G. Bar, Surf. Sci. 411 (1998) L802.