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Physical Review Letters

Volumn 86, Issue 11, 2001, Pages 2373-2376

Unambiguous interpretation of atomically resolved force microscopy images of an insulator

(4) Barth, C b Shluger, A L a Reichling, M b Foster, A S a

a UNIVERSITY COLLEGE LONDON (United Kingdom)

b UNIVERSITY OF MUNICH (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTAL LATTICES; ELECTRIC INSULATING MATERIALS; ELECTRIC POTENTIAL; ELECTROSTATICS; FLUORINE; IMAGE ANALYSIS;

CALCIUM DIFLUORIDE; SCANNING FORCE MICROSCOPY;

CALCIUM COMPOUNDS;

EID: 0035848210 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.86.2373 Document Type: Article

Times cited : (134)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.