Measuring average tip-sample forces in intermittent-contact (tapping) force microscopy in air

Applied Physics Letters

Volumn 76, Issue 7, 2000, Pages 930-932

  Fain Jr , S C ^a   Barry, K A ^a,b   Bush, M G ^a,c   Pittenger, B ^a   Louie, R N ^a,d  

^a UNIVERSITY OF WASHINGTON   (United States)

^b KLA TENCOR CORPORATION   (United States)

^c GOODRICH CORPORATION   (United States)

^d PACIFIC LUTHERAN UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000251068     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.125633     Document Type: Article

References (26)

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