Quantity measured in frequency-shift-mode atomic-force microscopy: an analysis with a numerical model

Physical Review B - Condensed Matter and Materials Physics

Volumn 59, Issue 20, 1999, Pages 13267-13272

  Terakura, K ^b   Uda, T ^a  

^a JT RES CENTER FOR ATOM TECHNOLOGY   (Japan)

^b NATL INST FOR ADV INTERDISC RES   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000340669     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.59.13267     Document Type: Article

References (11)

1. F. J. Giessibl, Science267, 68 (1995).
2. S. Kitamura and M. Iwatsuki, Jpn. J. Appl. Phys., Part 235, L145 (1995).
3. H. Ueyama, M. Ohta, Y. Sugawara, and S. Morita, Jpn. J. Appl. Phys., Part 234, L1086 (1995).
4. Y. Sugawara, M. Ohta, H. Ueyama, and S. Morita, Science270, 1646 (1995).
5. T. Uchihashi, Y. Sugawara, T. Tsukamoto, M. Ohta, S. Morita, and M. Suzuki, Phys. Rev. B56, 9834 (1997).
6. R. Pérez, M C. Payne, I. Štich, and K. Terakura, Phys. Rev. Lett.78, 678 (1997).
7. R. Pérez, I. Štich, M C. Payne, and K. Terakura, Phys. Rev. B58, 10 835 (1998).
8. S. H. Ke, T. Uda, and K. Terakura, Proceedings of ICPS24 (World Scientific, Singapore, 1998).
9. F. J. Giessibl, Phys. Rev. B56, 16 010 (1997).
10. Y. Sugawara in Defects in Electronic Materials II, edited by J. Michel et al., MRS Symposia Proceedings No. 442 (Materials Research Society, Pittsburgh, 1996), pp. 16–23.
11. F. J. Giessibl, Science260, 67 (1995).