Characterization of polymer surfaces with atomic force microscopy

Annual Review of Materials Science

Volumn 27, Issue 1, 1997, Pages 175-222

  Magonov, Sergei N ^a   Reneker, Darrell H ^b  

^a Digital Instruments   (United States)

^b The University of Akron   (United States)

Author keywords

AFM modes; Lamellar crystals; Microhardness; Nanostructure; Polymer morphology

Indexed keywords

ATOMIC FORCE MICROSCOPY; CONFORMATIONS; CRYSTAL MICROSTRUCTURE; HARDNESS; MOLECULAR STRUCTURE; MORPHOLOGY; NANOSTRUCTURED MATERIALS; PHASE SEPARATION; PLASTIC FILMS; SURFACE STRUCTURE; SYNTHETIC FIBERS;

CRYSTALLINE ORDER; ELASTIC INHOMOGENEITY; PHASE TOPOGRAPHY;

POLYMERS;

EID: 0030692153     PISSN: 00846600     EISSN: None     Source Type: Journal    
DOI: 10.1146/annurev.matsci.27.1.175     Document Type: Article

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