Basic properties of dynamic force spectroscopy with the scanning force microscope in experiment and simulation

Ultramicroscopy

Volumn 66, Issue 3-4, 1996, Pages 251-259

  Anczykowski, B ^a   Kruger D ^a   Babcock, K L ^b   Fuchs, H ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

^b Digital Instruments   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; DYNAMICS; OSCILLATIONS; SIGNAL PROCESSING; SPECTROSCOPY;

DYNAMIC FORCE SPECTROSCOPY (DFS); SCANNING FORCE MICROSCOPES (SFM);

MICROSCOPES;

ANALYTIC METHOD; ARTICLE; COMPUTER SIMULATION; DYNAMICS; INSTRUMENTATION; OSCILLATION; SCANNING FORCE MICROSCOPY; SIGNAL DETECTION; TOPOGRAPHY;

EID: 0030435432     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(97)00002-8     Document Type: Article

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