Attractive and repulsive tip-sample interaction regimes in tapping-mode atomic force microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 60, Issue 7, 1999, Pages 4961-4967

  García, Ricardo ^a   Paulo, Alvaro San ^a  

^a INSTITUTO DE MICROELECTRÓNICA DE MADRID   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000583552     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.60.4961     Document Type: Article

References (38)

1. Y. Martin, C. C. Williams, and H. K. Wickramasinghe, J. Appl. Phys., 61, 4723 (1987).
2. T. R. Albrecht, P. Grütter, D. Horne, and D. Rugar, J. Appl. Phys., 69, 668 (1991).
3. F. J. Giessibl, Science, 267, 68 (1995);
4. F. J. Giessibl, Phys. Rev. B, 56, 16 010 (1997).
5. M. Guggisberg, M. Bammerlin, R. Lüthi, Ch. Loppacher, F. Battiston, J. L.A. Baratoff, E. Meyer, and H.-J. Güntherodt, Appl. Phys. A: Mater. Sci. Process., 66, S245 (1998).
6. Q. Zhong, D. Imniss, K. Kjoller, and V. B. Elings, Surf. Sci., 290, L688 (1993).
7. R. Pérez, Y. Stich, M. Payne, and K. Terakura, Phys. Rev. B, 58, 10 835 (1998).
8. J. Tamayo and R. García, Langmuir, 12, 4430 (1996).
9. C. Bustamante and D. Keller, Phys. Today, 48(12), 33 (1995);
10. E. Margeat, C. Le Grimelle, and C. A. Royer, Biophys. J., 75, 2712 (1998).
11. G. Bar, Y. Thomann, and M.-H. Whangbo, Langmuir, 14, 1219 (1998).
12. R. García, M. Calleja, and F. Pérez-Murano, Appl. Phys. Lett., 72, 2295 (1998).
13. J. Chen, R. Workman, D. Sarid, and R. Höper, Nanotechnology, 5, 199 (1994).
14. R. G. Winkler, J. P. Spatz, S. Sheiko, M. Möller, R. Reineker, and O. Marti, Phys. Rev. B, 54, 8908 (1996).
15. B. Anczykowski, D. Krüger, and H. Fuchs, Phys. Rev. B, 53, 15 485 (1996).
16. N. A. Burham, O. P. Behrend, F. Ouveley, G. Gremaud, P.-J. Gallo, D. Gordon, E. Dupas, A. J. Kulik, H. M. Pollock, and G. A. D. Briggs, Nanotechnology, 8, 67 (1997).
17. S. John, T. Van Noort, Kees O. Van der Werf, Bart G. De Grooth, Niek F. Van Husl, and Jan Greve, Ultramicroscopy, 69, 117 (1997).
18. A. Kühle, A. H. Soerensen, and J. Bohr, J. Appl. Phys., 81, 6562 (1997).
19. A. Bugacov, R. Resch, C. Baur, N. Montoya, K. Woronowicz, A. Papson, B. E. Koel, A. Requicha, and P. Will, Probe Microscopy (to be published);
20. R. Resch, A. Bougacov, C. Baur, B. E. Koel, A. Madhukar, A. A. G. Requicha, and P. Will, Appl. Phys. A: Mater. Sci. Process., 67, 265 (1998).
21. D. Sarid, T. G. Rushell, R. K. Workman, and D. Chen, J. Vac. Sci. Technol. B, 14, 864 (1996).
22. U. Rabe, J. Turner, and W. Arnold, Appl. Phys. A: Mater. Sci. Process., 66, S277 (1998).
23. G. Chen, R. Warmack, A. Huang, and T. Thundat, J. Appl. Phys., 78, 1465 (1995).
24. S. Ciraci, E. Tekman, A. Baratoff, and Y. P. Batra, Phys. Rev. B, 46, 10 411 (1992).
25. J. Israelachvili, Intermolecular and Surface Forces (Academic, Orlando, 1991).
26. B. V. Derjaguin, V. M. Muller, and Y. P. Toporov, J. Colloid Interface Sci., 53, 314 (1975).
27. L. D. Landau and E. M. Lifshitz, Mechanics (Pergamon, Oxford, 1960).
28. J. M. T. Thompson and H. B. Stwart, Nonlinear Dynamics and Chaos (Wiley, New York, 1986).
29. P. Gleyzes, P. K. Kuo, and A. C. Boccara, Appl. Phys. Lett., 58, 2989 (1991).
30. S. Fain (unpublished).
31. A. P. French, Vibrations and Waves (Norton, New York, 1971).
32. J. Tamayo and R. García, Appl. Phys. Lett., 73, 2926 (1998).
33. J. Tamayo and R. García, Appl. Phys. Lett., 71, 2394 (1997).
34. A. San Paulo and R. García (unpublished).
35. B. Anczykowski, D. Krüger, K. L. Babcock, and H. Fuchs, Ultramicroscopy, 66, 251 (1996).
36. G. Haugstad and R. Jones, Ultramicroscopy, 76, 77 (1999).
37. X. Chen, M. C. Davies, C. J. Roberts, S. J. B. Tendler, P. M. Williams, J. Davies, A. C. Dawkes, and J. C. Edwards, Ultramicroscopy, 75, 171 (1998).
38. L. Wang, Appl. Phys. Lett., 73, 3781 (1998).