Observation of single- and double-stranded DNA using non-contact atomic force microscopy

Applied Surface Science

Volumn 140, Issue 3-4, 1999, Pages 400-405

  Maeda, Y ^a   Matsumoto, T ^a   Kawai, T ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

87.64.Dz; APN; DNA; Non contact atomic force microscopy; Secondary structures; Ultrahigh vacuum

Indexed keywords

EID: 0001584582     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00562-5     Document Type: Article

References (10)

1. Ushiki T., Hitomi J., Ogura S., Umemoto T., Shigono M. Arch. Histol. Cytol. 59:1996;421.
2. Hansma H.G., Revenko I., Kim K., Laney D.E. Nucleic Acids Res. 24:1996;713.
3. Hansma H.G., Laney D.E., Bezanilla M., Sinsheimer R.L. Biophys. J. 68:1995;1672.
4. Hansma H.G., Sinsheimer R.L., Groppe J., Bruice T.C., Elings V., Gurley G., Bezanilla M., Mastrangelo I.A., Hough P.V.C., Hansma P.K. Scanning. 15:1993;296.
5. Thundat T., Allison D.P., Warmack R.J. J. Vac. Sci. Technol. A. 11:1993;824.
6. Giessibl F.J. Science. 267:1995;68.
7. Uchihashi T., Sugawara Y., Tsukamoto T., Ohta M., Morita S. Phys. Rev. B. 56:1997;56.
8. Fukui K., Onishi H., Iwasawa Y. Phys. Rev. Lett. 79:1997;4202.
9. Kitamura S., Iwatsuki M. Jpn. J. App. Phys. 35:1996;668.
10. Sugawara Y., Ohta M., Ueyama H., Morita S. Science. 270:1995;1646.