Calculation of the frequency shift in dynamic force microscopy

Applied Surface Science

Volumn 140, Issue 3-4, 1999, Pages 344-351

  Holscher H ^a   Schwarz, U D ^a   Wiesendanger, R ^a  

^a UNIVERSITY OF HAMBURG   (Germany)

Author keywords

02.60.Cb; 07.79.Lh; 61.16.Ch; APN; Atomic force microscopy; Dynamic force microscopy; Frequency modulation force microscopy; Frequency shift; Oscillating cantilever; Tip sample interaction

Indexed keywords

EID: 2642577006     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00552-2     Document Type: Article

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