Linearity of amplitude and phase in tapping-mode atomic force microscopy

Physical Review B - Condensed Matter and Materials Physics

Volumn 61, Issue 2, 2000, Pages 1106-1115

  Salapaka, M ^a   Chen, D ^a  

^a Iowa State University of Science and Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000096909     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.61.1106     Document Type: Article

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