Description of phase imaging in tapping mode atomic force microscopy by harmonic approximation

Surface Science

Volumn 411, Issue 1-2, 1998, Pages

  Whangbo, Myung Hwan ^a   Bar, Georg ^b   Brandsch, Rainer ^b  

^a NORTH CAROLINA STATE UNIVERSITY   (United States)

^b UNIVERSITY OF FREIBURG   (Germany)

Author keywords

Atomic force microscopy; Effective quality factor; Energy dissipation; Harmonic approximation; Phase imaging; Tapping mode atomic force microscopy

Indexed keywords

APPROXIMATION THEORY; ATOMIC FORCE MICROSCOPY; ELASTOMERS; ENERGY DISSIPATION; HARMONIC ANALYSIS; MATHEMATICAL MODELS; NATURAL FREQUENCIES; PHASE SHIFT; SURFACE PHENOMENA; VIBRATIONS (MECHANICAL);

HARMONIC APPROXIMATION; POLYDIMETHYLSILOXANE; TAPPING MODE ATOMIC FORCE MICROSCOPY;

SILICONES;

EID: 0347873763     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(98)00349-5     Document Type: Article

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