How does a tip tap?

Nanotechnology

Volumn 8, Issue 2, 1997, Pages 67-75

  Burnham, N A ^a   Behrend, O P ^a   Oulevey, F ^a   Gremaud, G ^a   Gallo, P J ^a   Gourdon, D ^a   Dupas, E ^a   Kulik, A J ^a   Pollock, H M ^b   Briggs, G A D ^c  

^a EPFL   (Switzerland)

^b LANCASTER UNIVERSITY   (United Kingdom)

^c UNIVERSITY OF OXFORD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION; COMPUTER SIMULATION; DAMPING; IMPACT TESTING; MATHEMATICAL MODELS; STIFFNESS;

ATOMIC FORCE MICROSCOPE (AFM) CANTILEVERS; TOPOGRAPHIC TAPPING IMAGES;

ATOMIC FORCE MICROSCOPY;

EID: 0031168207     PISSN: 09574484     EISSN: None     Source Type: Journal    
DOI: 10.1088/0957-4484/8/2/004     Document Type: Article

References (35)

1. Zhong Q, Inniss D, Kjoller K and Elings VB 1993 Surf. Sci. Lett. 290 L688-92
2. Chernoff D A 1995 High resolution chemical mapping using tapping mode AFM with phase contrast Proc. Microscopy and Microanalysis 1995
3. Umemura K, Arakawa H and Ikai A 1993 Japan. J. Appl. Phys. 32 L1711-14
4. Bustamante C and Keller D 1995 Phys. Today December 32-8
5. Howard A J, Rye R R and Houston J E 1996 J. Appl. Phys. 79 1885-90
6. Gregor M J, Blome P G, Schöfer J and Ulbrich R G 1996 Appl. Phys. Lett. 68 307-9
7. Giessibl F J 1995 Science 267 68-71
8. Chen G Y, Warmack R J, Huang A and Thundat T 1995 J. Appl. Phys. 78 1465-9
9. Anczykowski B, Krüger D and Fuchs H 1996 Phys. Rev. B 53 15485-8
10. Spatz J P, Sheiko S, Möller M, Winkler R G, Reineker P and Marti O 1995 Nanotechnology 6 40-4
11. Sarid D, Ruskell T G, Workman R K and Chen D 1996 J. Vac. Sci. Technol. B 14 864-7
12. Winkler R G, Spatz J P, Sheiko S, Möller M, Reineker R and Marti O 1996 Phys. Rev. B 54 8908-12
13. Tamayo J and García R 1996 Langmuir 12 4430-5
14. Sarid D, Chen J and Workman RK 1995 Comput. Mat. Sci. 3 475-80
15. Putman C A J, Van der Werf K O, De Grooth B G, Van Hulst N F and Greve J 1994 Appl. Phys. Lett. 64 2454-6
16. Chen J, Workman R K, Sarid D and Höper R 1994 Nanotechnology 5 199-204
17. Maugis D 1992 J. Coll. Interface Sci. 150 243-69
18. Maugis D and Gauthier-Manuel B 1994 J. Adhesion Sci. Technol. 8 1311-22
19. Muller V M, Yushenko V S and Derjaguin B V 1980 J. Colloid Interface Sci. 77 91
20. Johnson K L 1985 Contact Mechanics (Cambridge: Cambridge University Press)
21. Derjaguin B V, Muller V M and Toporov YP 1975 J. Coll. Interface Sci. 53 314-26
22. Sperling G 1964 Eine Theorie der Haftung von Feststoffteilchen an festern Körpern PhD Thesis Fakultät der Maschinenwesen T H Karlsruhe
23. Johnson K L, Kendall K and Roberts AD 1971 Proc. R. Soc. A 324 301-13
24. Burnham N A and Colton R J 1993 Force microscopy Scanning Tunneling Microscopy and Spectroscopy: Theory, Techniques and Applications ed D A Bonnell (New York: VCH) pp 191-249
25. Hughes B D and White L R 1979 J. Mech. Appl Math. 32 445
26. Greenwood J A Proc. K. Soc. accepted
27. Dugdale D S 1960 J. Mech. Phys. Solids 8 100
28. Burnham N A, Colton R J and Pollock HM 1993 Nanotechnology 4 64-80
29. Israelachvili J N 1985 Intermolecular and Surface Forces (New York: Academic)
30. Burnham N A, Colton R J and Pollock H M 1992 Phys. Rev. Lett. 69 144-7
31. Chen G Y, Warmack R J, Oden P I and Thundat T 1996 J. Vac. Sci. Technol. B 14 1313-7
32. Kolosov O and Yamanaka K 1993 Japan. J. Appl. Phys., 32 L1095-8
33. Yamanaka K 1995 New approaches in acoustic microscopy for noncontact measurement and ultrahigh resolution Advances in Acoustic Microscopy vol I, ed GAD Briggs (New York: Plenum)
34. Burnham N A, Kulik A J, Gremaud G, Gallo P-J and Oulevey F 1996 J. Vac. Sci. Technol. B 14 794-9
35. Burnham N A, Kulik A J, Gremaud G and Briggs G A D 1995 Phys. Rev. Lett. 74 5092-5