True atomic resolution on the surface of an insulator via ultrahigh vacuum dynamic force microscopy

Probe Microscopy

Volumn 1, Issue 1, 1997, Pages 3-9

  Bammerlin, M ^a   Luthi, R ^a   Meyer, E ^a   Baratoff, A ^a   Lu, J ^a   Guggisberg, M ^a   Gerber, Ch ^a   Howald, L ^a   Guntherodt, H J ^a  

^a UNIVERSITY OF BASEL   (Switzerland)

Author keywords

Atomic resolution; NaCl(001); Non contact AFM; Point defects; UHV

Indexed keywords

ARTICLE; MICROSCOPE; MICROSCOPY; OPTICAL RESOLUTION; OSCILLATION; TOPOGRAPHY;

EID: 0031544163     PISSN: 1355185X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (20)