Low temperature scanning force microscopy of the si(111)-(7×7) surface

Physical Review Letters

Volumn 84, Issue 12, 2000, Pages 2642-2645

  Lantz, M A ^a   Hug, H J ^a   Van Schendel, P J A ^a   Hoffmann, R ^a   Martin, S ^a   Baratoff, A ^a   Abdurixit, A ^a   Guntherodt H J ^a   Gerber, C H ^b  

^a UNIVERSITY OF BASEL   (Switzerland)

^b IBM RESEARCH ZURICH   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001451755     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.84.2642     Document Type: Article

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