Non-contact atomic force microscopy imaging of TiO 2 (100) surfaces

Applied Surface Science

Volumn 140, Issue 3-4, 1999, Pages 271-275

  Raza, H ^a   Pang, C L ^a   Haycock, S A ^a   Thornton, G ^a  

^a UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

61.16Ch; 68.35Bs; APN; NC AFM; Surface structure; TiO 2 (100); TP

Indexed keywords

EID: 0001252796     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(98)00539-X     Document Type: Article

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