Site discrimination of adatoms in Si(111)-7 × 7 by noncontact atomic force microscopy

Surface Science

Volumn 373, Issue 1, 1997, Pages

  Nakagiri, Nobuyuki ^a   Suzuki, Masatoshi ^a   Okiguchi, Keiko ^a   Sugimura, Hiroyuki ^a  

^a NIKON CORPORATION   (Japan)

Author keywords

Atomic force microscopy; Silicon; Single crystal surfaces; Surface relaxation and reconstruction

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMS; RELAXATION PROCESSES; SURFACES;

ADATOM; NONCONTACT ATOMIC FORCE MICROSCOPY; SURFACE RECONSTRUCTION;

SILICON;

EID: 0031077589     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0039-6028(96)01276-9     Document Type: Article

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