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Applied Physics A: Materials Science and Processing

Volumn 66, Issue SUPPL. 1, 1998, Pages

Phase contrast in tapping-mode scanning forcemicroscopy

(4) Garcia R a Tamayo, J a Calleja, M a Garcia F a

a INSTITUTO DE MICROELECTRÓNICA DE MADRID (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ADHESION ENERGY; ADHESION FORCES; CANTILEVER EXCITATION; HETEROGENEOUS SURFACE; LATERAL FORCE; MICA SURFACES; NON-CONTACT; PHASE CONTRASTS; PHASE-CONTRAST IMAGE; RAPID DEVELOPMENT; SCANNING FORCE MICROSCOPES; TAPPING MODES; TAPPING-MODE OPERATIONS; TIP-SAMPLE INTERACTION;

ADHESION; ENERGY DISSIPATION; MICA; PHASE SHIFT; SILICATE MINERALS;

MECHANICAL PROPERTIES;

EID: 0001261476 PISSN: 09478396 EISSN: 14320630 Source Type: Journal
DOI: 10.1007/s003390051152 Document Type: Article

Times cited : (69)

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