Subatomic features on the silicon (111)-(7x7) surface observed by atomic force microscopy

Science

Volumn 289, Issue 5478, 2000, Pages 422-425

  Giessibl, Franz J ^a   Hembacher, S ^a   Bielefeldt, H ^a   Mannhart, J ^a  

^a UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL ANALYSIS; CHEMICAL BOND; CHEMICAL INTERACTION; CHEMICAL STRUCTURE; PRIORITY JOURNAL; STRUCTURE ANALYSIS;

EID: 0034698297     PISSN: 00368075     EISSN: None     Source Type: Journal    
DOI: 10.1126/science.289.5478.422     Document Type: Article

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22. We thank D. Schlom for discussions, K. Wiedenmann for technical assistance, and Nanosurf AG for supplying components of the force sensor and a phase-locked-loop frequency demodulator. This work is supported by the Bundesministerium für Bildung, Wissenschaft, Forschung und Technologie (project number 13N6918/1).