HEATED ATOMIC FORCE MICROSCOPE CANTILEVERS AND THEIR APPLICATIONS

Annual Review of Heat Transfer

Volumn 16, Issue , 2013, Pages 287-326

  King, William P ^a   Bhatia, Bikramjit ^a   Felts, Jonathan R ^a   Kim, Hoe Joon ^a   Kwon, Beomjin ^a   Lee, Byeonghee ^a   Somnath, Suhas ^a   Rosenberger, Matthew ^a  

^a University of Illinois at Urbana Champaign   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; INTERFACES (MATERIALS); NANOCANTILEVERS;

ATOMIC FORCE MICROSCOPE CANTILEVERS; CANTILEVER TIP; HEAT-FLOW; HOTSPOTS; INTEGRATED HEATER; MATERIALS CHARACTERIZATION; NANO-MANUFACTURING; NANO-METER-SCALE; NEW APPLICATIONS; TEMPERATURE RANGE;

HEAT TRANSFER;

EID: 85015614785     PISSN: 10490787     EISSN: 23750294     Source Type: Book Series    
DOI: 10.1615/AnnualRevHeatTransfer.v16.100     Document Type: Chapter

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